The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2020
Filed:
Jun. 24, 2015
Qi2 Elements, Llc, Kent, WA (US);
Haraprasad Kannajosyula, Seattle, WA (US);
Giovanni Nino, Issaquah, WA (US);
Phillip D. Bondurant, Covington, WA (US);
Vincent Fratello, Bellevue, WA (US);
Q12 Elements, LLC, Kent, WA (US);
Abstract
A method of inspecting a pipe for flaws includes emitting ultrasonic waves, controlling the emission of the ultrasonic waves, receiving reflections of the ultrasonic waves, and determining at least one characteristic of one or more flaws. The ultrasonic waves are emitted in a helical pattern through the pipe from an array of ultrasonic transducer elements. The emission of the ultrasonic waves from the array is controlled such that the ultrasonic waves are emitted at a plurality of helical angles within a range of helical angles. The reflections of the ultrasonic waves are caused by impingement of the ultrasonic waves on the one or more flaws. The at least one characteristic of the one or more flaws is determined based on the received reflections of the ultrasonic waves.