The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2020
Filed:
Jan. 25, 2018
Fbs, Inc., Bellefonte, PA (US);
Cody J. Borigo, Port Matilda, PA (US);
John C. McLaughlin, Bellefonte, PA (US);
Steven E. Owens, Bellefonte, PA (US);
Joseph L. Rose, State College, PA (US);
FBS, Inc., Bellefonte, PA (US);
Abstract
A system for non-destructive inspection of a structure includes at least one magnetostrictive strip, a plurality of coil circuits, a jacket having at least one component layer, and a tensioner. The at least one magnetostrictive strip is configured to be induced with a bias magnetic field and be wrapped at least partially around an outer surface of the structure. The plurality of coil circuits are configured to be disposed adjacent to the at least one magnetostrictive strip, and the jacket is configured to be disposed adjacent to at least one of the plurality of coil circuits. The tensioner is configured to provide a mechanical pressure coupling between said at least one magnetostrictive strip and said structure. At least one of the plurality of coil circuits is individually controllable by a number of channels to at least one of excite or detect guided waves in said structure.