The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2020

Filed:

Jul. 20, 2018
Applicants:

Tae Sik Jung, Daejeon, KR;

Yong Kyoon Mok, Daejeon, KR;

Yoon Ho Kim, Daejeon, KR;

Chung Yong Lee, Daejeon, KR;

Hun Jang, Sejong-si, KR;

Inventors:

Tae Sik Jung, Daejeon, KR;

Yong Kyoon Mok, Daejeon, KR;

Yoon Ho Kim, Daejeon, KR;

Chung Yong Lee, Daejeon, KR;

Hun Jang, Sejong-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/2251 (2018.01); G01N 23/203 (2006.01); G01N 33/20 (2019.01);
U.S. Cl.
CPC ...
G01N 23/2251 (2013.01); G01N 23/203 (2013.01); G01N 33/20 (2013.01); G01N 2223/053 (2013.01); G01N 2223/0561 (2013.01); G01N 2223/418 (2013.01); G01N 2223/602 (2013.01);
Abstract

The present invention relates to a recrystallization rate measurement method of zirconium alloy cladding of a nuclear fuel rod, the method including: step 1 of irradiating SEM electron beams at a given scanning interval onto a first specimen to a third specimen which were electrolytically polished and obtaining electron backscattered signals therefrom by an EBSD camera; step 2 of converting electron backscattered signals obtained in step 1 into pattern quality values, respectively, and generating the pattern quality values as frequencies by a specified interval; step 3 of obtaining pattern quality frequencies (B+D) which are a portion of a whole frequency distribution of the second specimen, and pattern quality frequencies (D+E) which are a portion of a whole frequency distribution of the first specimen; and step 4 of obtaining the recrystallization rate of the second specimen with an equation of


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