The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2020
Filed:
Jul. 27, 2017
Bruker Axs Handheld, Inc., Kennewick, WA (US);
Brian Scott Parks, Kennewick, WA (US);
Robert Matthew Burton, West Richland, WA (US);
Robert Francis Shannon, Jr., Richland, WA (US);
Jiyan Gu, Seattle, WA (US);
Lance Thompson Doyle, Walla Walla, WA (US);
Fredericus Vosman, Richland, WA (US);
Kenneth Dean Wheeler, Spokane, WA (US);
Michael Scott Kirsch, Richland, WA (US);
Bruker Handheld LLC, Kennewick, WA (US);
Abstract
A system and method for processing X-ray fluorescence data in a hand-held X-ray Fluorescence (XRF) analyzer are provided. The X-ray fluorescence (XRF) analyzer includes a radiation source assembly including a first centerline axis and configured to direct an X-ray beam to impinge on a sample to be tested. The XRF analyzer also includes a radiation detector assembly including a second centerline axis configured to sense X-ray fluorescence (XRF) emitted from the sample in response to the X-ray beam. The XRF analyzer further includes a processor configured to determine a property of the sample to be tested from the emitted XRF, and a proximity sensor configured to continuously measure a distance between the XRF analyzer and the sample to be tested, the distance being at least one of displayed to a user and used by the processor to determine the property.