The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2020
Filed:
Aug. 31, 2017
Nuctech Company Limited, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Yuanjing Li, Beijing, CN;
Shangmin Sun, Beijing, CN;
Yu Hu, Beijing, CN;
Xuejing Yang, Beijing, CN;
Qiangqiang Wang, Beijing, CN;
Long Du, Beijing, CN;
Wei Li, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Abstract
This invention relates to a movable article inspection system and inspection method, wherein the inspection system comprises: a first automated guided vehicle, a radiation source and a detection mechanism; said radiation source and said detection mechanism are both mounted on said first automated guided vehicle, said first automated guided vehicle is able to move to a preset scanning inspection position, such that scanning inspection of said article to be scanned is effectuated by means of relative movement between an article to be scanned and the first automated guided vehicle. Such movable inspection system based on an automated guided vehicle is capable of making full use of an existing automated guided vehicle and its control system to make a movement path of the inspection system more flexible, and capable of effectuating centralized control and management of the inspection system, so that it can improve inspection efficiency, and save labor cost.