The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2020
Filed:
Dec. 23, 2015
Tsinghua University, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Li Zhang, Beijing, CN;
Le Shen, Beijing, CN;
Qingping Huang, Beijing, CN;
Xin Jin, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Tsinghua University, Beijing, CN;
Abstract
An X-ray imaging system and method are provided. The system may include: an X-ray source configured to irradiate X-ray beams; a first grating and a second grating arranged sequentially in an irradiation direction of the X-ray beams; a detector arranged at downstream of the second grating in the irradiation direction; and a controller and data processing device configured to control the X-ray source to irradiate the X-ray beams, to control the detector to receive X-ray beams passing through the first grating and the second grating to generate phase contrast information and/or dark field information, and to perform CT check on an object under check based on the phase contrast information and/or the dark field information to obtain a CT image. In this way, it is possible to obtain more characteristic information about the object under check, so as to achieve more precise material recognition and security check.