The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2020
Filed:
Sep. 15, 2016
Applicant:
New York University, New York, NY (US);
Inventors:
David B. Ruffner, New York, NY (US);
David G. Grier, New York, NY (US);
Laura Philips, New York, NY (US);
Assignee:
NEW YORK UNIVERSITY, New York, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/02 (2006.01); G01N 15/14 (2006.01); G01N 21/45 (2006.01); G03H 1/04 (2006.01); G03H 1/00 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0227 (2013.01); G01N 15/1434 (2013.01); G01N 15/1459 (2013.01); G01N 15/1463 (2013.01); G01N 21/453 (2013.01); G03H 1/0005 (2013.01); G03H 1/0443 (2013.01); G01N 2015/0053 (2013.01); G01N 2015/0233 (2013.01); G01N 2015/1454 (2013.01); G01N 2015/1493 (2013.01); G03H 2001/005 (2013.01); G03H 2001/0033 (2013.01); G03H 2001/0447 (2013.01);
Abstract
Impurities within a sample are detected by use of holographic video microscopy. The sample flows through the microscope and holographic images are generated. The holographic image is analyzed to identify regions associated with large impurities in the sample. The contribution of the particles of the sample to the holographic images is determined and the impurities are characterized.