The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2020

Filed:

May. 06, 2019
Applicant:

Rapiscan Systems, Inc., Torrance, CA (US);

Inventors:

James P. Bilodeau, Gardner, MA (US);

Thomas A. Hagerty, Melrose, MA (US);

Assignee:

Rapiscan Systems, Inc., Torrance, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/02 (2006.01);
U.S. Cl.
CPC ...
G01N 1/02 (2013.01); G01N 2001/022 (2013.01); G01N 2001/028 (2013.01);
Abstract

The present disclosure includes a sampling device for collecting a sample from a target surface, the sample device including a handle, a body extending from the handle, a sampling head coupled to the body opposite said handle, wherein the sampling head is configured such that, when a mechanical force is applied to the handle, the body rotates to enable a collection of the sample from the target surface by the sampling head, and a mechanical force feedback mechanism. The mechanical force feedback mechanism includes a rotational junction connecting the body to the handle and a pin rotatably coupling the body with the handle, and is configured to prevent a further rotation of the body when a threshold amount of force is applied to the handle.


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