The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2020
Filed:
Aug. 17, 2017
Boe Technology Group Co., Ltd., Beijing, CN;
Beijing Boe Display Technology Co., Ltd., Beijing, CN;
Xianglong Li, Beijing, CN;
Xiaoran Duan, Beijing, CN;
Changkai Zhao, Beijing, CN;
Quanyue Li, Beijing, CN;
Feng He, Beijing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
BEIJING BOE DISPLAY TECHNOLOGY CO., LTD., Beijing, CN;
Abstract
The present disclosure provides an apparatus and method for measuring a clearance. The apparatus comprises: a first measurement component configured to be mounted on a first object in a mounted state thereof, so that a first measurement surface of the first measurement component is aligned with a first surface to be measured of the first object; and a second measurement component configured to be mounted on a second object in a mounted state thereof, so that a second measurement surface of the second measurement component is aligned with a second surface to be measured of the second object, wherein the first measurement component comprises a measurement instrument configured to measure a first distance between the measurement instrument and the first measurement surface and a second distance between the measurement instrument and the second measurement surface, wherein the clearance is calculated based on the first distance and the second distance.