The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2020

Filed:

Feb. 27, 2018
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventor:

Tsutomu Sasaki, Ashigara-kami-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C09K 11/56 (2006.01); B82Y 5/00 (2011.01); C01B 25/08 (2006.01); C09K 11/06 (2006.01); C09K 11/70 (2006.01); B82Y 30/00 (2011.01); B82Y 20/00 (2011.01); B82Y 40/00 (2011.01);
U.S. Cl.
CPC ...
C09K 11/565 (2013.01); B82Y 5/00 (2013.01); C01B 25/087 (2013.01); C09K 11/06 (2013.01); C09K 11/70 (2013.01); B82Y 20/00 (2013.01); B82Y 30/00 (2013.01); B82Y 40/00 (2013.01); Y10S 977/774 (2013.01); Y10S 977/816 (2013.01); Y10S 977/818 (2013.01); Y10S 977/819 (2013.01); Y10S 977/824 (2013.01); Y10S 977/892 (2013.01); Y10S 977/95 (2013.01);
Abstract

An object of the present invention is to provide a semiconductor nanoparticle having high emission efficiency and excellent durability; a method of producing the same; and a dispersion liquid and a film obtained by using a semiconductor nanoparticle. The semiconductor nanoparticle of the present invention is a semiconductor nanoparticle in which oxygen, zinc, and sulfur are detected by X-ray photoelectron spectroscopy analysis and a peak (I) which is derived from a hydrocarbon group and present in a range of 2800 cmto 3000 cmand a peak (I) which is derived from COOand present in a range of 1400 cmto 1600 cmare detected by Fourier transform infrared spectroscopy analysis.


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