The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2020

Filed:

May. 29, 2015
Applicant:

Essilor International, Charenton-le-Pont, FR;

Inventors:

Sebastien Piraube, Dallas, TX (US);

Brad J. Gelb, Dallas, TX (US);

Assignee:

Essilor International, Charenton-le-Pont, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B24B 13/06 (2006.01); G05B 19/404 (2006.01); G05B 19/418 (2006.01); B29D 11/00 (2006.01); B24B 13/00 (2006.01);
U.S. Cl.
CPC ...
B24B 13/06 (2013.01); B24B 13/00 (2013.01); B29D 11/00 (2013.01); B29D 11/00423 (2013.01); B29D 11/00951 (2013.01); G05B 19/404 (2013.01); G05B 19/41875 (2013.01); G05B 2219/45157 (2013.01); Y02P 90/22 (2015.11); Y02P 90/265 (2015.11);
Abstract

A real-time calculation system capable of computing the industrial optical performance and yields of a prescription laboratory is disclosed. The system uses statistical analysis to determine the compensation factors that can be applied to given products, Semi-Finish, materials, or lens designs to increase the lab yields. Using a monitoring and configuration system, the user tracks the evolution of the laboratory's performance and identifies areas in which yields are impacted. The user defines how the calculation system will optimize the laboratory's performance, such as by defining how the compensation factors will be calculated and applied.


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