The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2020
Filed:
Feb. 21, 2019
Systems and methods for measuring radiated thermal energy during an additive manufacturing operation
Sigma Labs, Inc., Santa Fe, NM (US);
Darren Beckett, Corrales, NM (US);
Scott Betts, Albuquerque, NM (US);
Martin Piltch, Los Alamos, NM (US);
R. Bruce Madigan, Butte, MT (US);
Lars Jacquemetton, Santa Fe, NM (US);
Glenn Wikle, Santa Fe, NM (US);
Mark J. Cola, Santa Fe, NM (US);
Vivek R. Dave, Concord, NH (US);
Alberto M. Castro, Santa Fe, NM (US);
Roger Frye, Santa Fe, NM (US);
SIGMA LABS, INC., Santa Fe, NM (US);
Abstract
This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensing system that monitors two discrete wavelengths associated with a blackbody radiation curve of the layer of powder; determining temperature variations for an area of the build plane traversed by the scans based upon a ratio of sensor readings taken at the two discrete wavelengths; determining that the temperature variations are outside a threshold range of values; and thereafter, adjusting subsequent scans of the energy source across or proximate the area of the build plane.