The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2020

Filed:

May. 14, 2019
Applicant:

The Boeing Company, Chicago, IL (US);

Inventors:

Morteza Safai, Newcastle, WA (US);

Jeffrey G. Thompson, Auburn, WA (US);

Assignee:

THE BOEING COMPANY, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B08B 5/02 (2006.01); G01N 21/94 (2006.01); G01N 21/88 (2006.01); B29C 70/30 (2006.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
B08B 5/02 (2013.01); B29C 70/30 (2013.01); G01N 21/8851 (2013.01); G01N 21/94 (2013.01); G01N 2021/8472 (2013.01); G01N 2201/103 (2013.01);
Abstract

A system for the detection of foreign object debris material on a surface includes an ultraviolet light source configured to direct ultraviolet light across a surface. The surface is an outer surface of a composite part being formed by a composite layup machine. The system includes an ultraviolet light camera configured to scan the surface and output a first signal proportional to reflected ultraviolet light reflected by at least one of the surface and a first type of foreign object debris material. The reflected ultraviolet light is responsive to the ultraviolet light from the ultraviolet light source. The system also includes a controller coupled to the ultraviolet light source and to the ultraviolet light camera. The controller is configured to compare the first signal from the ultraviolet light camera with a first threshold to detect presence of the first type of foreign object debris material.


Find Patent Forward Citations

Loading…