The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2020

Filed:

Apr. 18, 2017
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Katsuya Oikawa, Tokyo, JP;

Kenichi Nagae, Yokohama, JP;

Makoto Yamakawa, Kyoto, JP;

Tsuyoshi Shiina, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/08 (2006.01); A61B 8/00 (2006.01); G01S 7/52 (2006.01);
U.S. Cl.
CPC ...
A61B 8/485 (2013.01); A61B 8/085 (2013.01); A61B 8/0858 (2013.01); A61B 8/4483 (2013.01); A61B 8/5223 (2013.01); A61B 8/585 (2013.01); G01S 7/52042 (2013.01);
Abstract

Viscoelastic characteristics in a subject are imaged by a simple method. A viscoelasticity measurement reference layer whose elastic modulus and viscosity coefficient are known is included between an ultrasonic wave transmitting/receiving probe and the subject and distributions of elastic modulus and viscosity coefficient inside the subject are calculated from a change over time of strain generated in the viscoelasticity measurement reference layer and the subject according to a pressure applied to the subject which changes over time and known elastic modulus and viscosity coefficient of the viscoelasticity measurement reference layer.


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