The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2020

Filed:

Feb. 28, 2017
Applicant:

Hewlett Packard Enterprise Development Lp, Houston, TX (US);

Inventors:

Renato Keshet, Haifa, IL;

Yaniv Sabo, Haifa, IL;

Assignee:

MICRO FOCUS LLC, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2013.01); H04L 29/06 (2006.01); G06F 21/55 (2013.01); G06N 20/10 (2019.01); G05B 23/02 (2006.01); G05D 7/06 (2006.01);
U.S. Cl.
CPC ...
H04L 63/1425 (2013.01); G06F 21/552 (2013.01); G06N 20/10 (2019.01);
Abstract

In some examples, a plurality of multi-dimensional data samples representing respective behaviors of entities in a computing environment are sorted, where the sorting is based on values of dimensions of each respective multi-dimensional data sample. For a given multi-dimensional data sample, a subset of the plurality of multi-dimensional data samples is selected based on the sorting. An anomaly indication is computed for the given multi-dimensional data sample based on applying a function on the multi-dimensional data samples in the subset. It is determined whether the given multi-dimensional data sample represents an anomalous entity in the computing environment based on the computed anomaly indication.


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