Millimeter wave test systems

Abstract

An electronic device may be provided with wireless circuitry that handles millimeter wave communications. The wireless circuitry may be tested using a test system that includes a fixture, computing equipment, and a substrate placed in the fixture. The fixture may hold an array of antennas on the substrate at a selected distance from an array of antennas on the wireless circuitry under test. The array on the substrate may receive millimeter wave test signals from the wireless circuitry under test. A transmission line may convey the millimeter wave test signals to a signal analyzer without down-converting the signals. The analyzer and computing equipment may identify performance metric data based on the test signals and may determine whether the wireless circuitry has satisfactory performance based on the performance metric data. The test system may be calibrated using settings that are specific to the design of the wireless circuitry under test.