The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2020

Filed:

Sep. 24, 2018
Applicant:

Western Digital Technologies, Inc., San Jose, CA (US);

Inventors:

Lei Lin, San Jose, CA (US);

Wei Zhao, San Jose, CA (US);

Henry Chin, San Jose, CA (US);

Yingda Dong, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/04 (2006.01); G11C 16/08 (2006.01); G11C 5/06 (2006.01); G11C 16/28 (2006.01); G11C 11/4097 (2006.01); G11C 16/24 (2006.01);
U.S. Cl.
CPC ...
G11C 16/0483 (2013.01); G11C 5/063 (2013.01); G11C 11/4097 (2013.01); G11C 16/08 (2013.01); G11C 16/24 (2013.01); G11C 16/28 (2013.01);
Abstract

Methods and systems for improving the reliability of stored data in the presence of cross-temperature variation are described. To reduce the number of data errors caused by cross-temperature variation, two or more sensing passes may be performed corresponding with two or more different sensing times. The amount of shifting in the memory cell threshold voltages may be determined on a per-bit basis or on a cell-by-cell basis based on the sensing operations performed during the two or more sensing passes. The stored data states may be assigned based on the amount of shifting in the memory cell threshold voltages during the two or more sensing passes and the type of cross-temperature variation present (e.g., whether the memory cells were programmed at a temperature above 65 degrees Celsius and read back at a temperature below 25 degrees Celsius).


Find Patent Forward Citations

Lin, Lei. (2020). Multi-sensing scan for cross-temperature mitigation (U.S. Patent No. 10636488). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10636488

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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