The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2020
Filed:
Nov. 06, 2017
Hitachi, Ltd., Tokyo, JP;
Jumpei Honda, Tokyo, JP;
Takuma Nishimura, Tokyo, JP;
Yoshimi Fujimata, Tokyo, JP;
Hiroshige Kashiwabara, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
An automatic inspection system, which includes a wireless slave device having a reading device that acquires a physical quantity to be inspected and a wireless master device that receives measurement data of the physical quantity from the wireless slave device, is provided with a data collection device that collects the measurement data from the wireless slave device via the wireless master device in a constant cycle and detects a time zone in which the measurement data is non-acquirable by the reading device based on a result of the collection. The wireless master device performs control to avoid the wireless slave device from re-acquisition of the measurement data in the non-acquirable time zone based on a result of the detection of the non-acquirable time zone.