The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2020

Filed:

Jan. 05, 2018
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Yan Deng, San Diego, CA (US);

Michel Adib Sarkis, San Diego, CA (US);

Yingyong Qi, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/13 (2017.01); G06T 17/20 (2006.01); G06T 15/40 (2011.01); G06T 7/162 (2017.01); G06T 7/136 (2017.01); G06T 7/543 (2017.01); G06T 17/00 (2006.01);
U.S. Cl.
CPC ...
G06T 17/20 (2013.01); G06T 7/13 (2017.01); G06T 7/136 (2017.01); G06T 7/162 (2017.01); G06T 7/543 (2017.01); G06T 15/40 (2013.01); G06T 17/00 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/30196 (2013.01);
Abstract

A method performed by an electronic device is described. The method includes incrementally adding a current node to a graph. The method also includes incrementally determining a respective adaptive edge threshold for each candidate edge between the current node and one or more candidate neighbor nodes. The method further includes determining whether to accept or reject each candidate edge based on each respective adaptive edge threshold. The method additionally includes performing refining based on the graph to produce refined data. The method also includes producing a three-dimensional (3D) model based on the refined data.


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