The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2020
Filed:
Dec. 28, 2017
Beijing Jingdong Shangke Information Technology Co., Ltd., Beijing, CN;
Jd.com American Technologies Corporation, Mountain View, CA (US);
Yi Xu, Menlo Park, CA (US);
Shanglin Yang, Sunnyvale, CA (US);
Yuzhang Wu, Santa Clara, CA (US);
Hui Zhou, Sunnyvale, CA (US);
Beijing Jingdong Shangke Information Technology Co., Ltd., Beijing, CN;
JD.com American Technologies Corporation, Mountain View, CA (US);
Abstract
A method for simultaneous localization and mapping. The method includes the step of detecting two-dimensional (2D) feature points from a current frame captured by a camera; matching the 2D feature points from the current frame directly to three-dimensional (3D) map points in a 3D map, so as to obtain correspondence between the 2D feature points and the 3D map points; and computing a current pose of the camera based on the obtained correspondence. Each of the 2D feature points and the 3D map points has a feature descriptor. The step of matching is performed by comparing the feature descriptors of the 2D feature points and the feature descriptors of the 3D map points.