The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2020
Filed:
Dec. 19, 2017
Industrial Technology Research Institute, Hsinchu, TW;
Keng-Hao Chang, Taichung, TW;
Wei-Yao Chiu, Chiayi, TW;
Ya-Hui Tsai, Taoyuan, TW;
Jwu-Sheng Hu, Zhubei, TW;
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE, Hsinchu, TW;
Abstract
An automated optical inspection (AOI) image classification method includes sending a plurality of NG information of a plurality of samples from an AOI device into an Artificial Intelligence (AI) module; performing discrete output calculation on the NG information of the samples by the AI module to obtain a plurality of classification information of the samples; performing kernel function calculation on the classification information of the samples by the AI module to calculate respective similarity distances of the samples and performing weighting analysis; based on weighting analysis results of the samples, judging classification results of the samples; and based on the classification results of the samples, performing classification of the samples.