The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2020
Filed:
Jul. 31, 2017
Applicant:
Ricoh Company, Ltd., Tokyo, JP;
Inventor:
Takayuki Hara, Kanagawa, JP;
Assignee:
RICOH COMPANY, LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06K 9/66 (2006.01); G06N 3/04 (2006.01); G06T 7/11 (2017.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4671 (2013.01); G06K 9/66 (2013.01); G06N 3/0454 (2013.01); G06N 3/0472 (2013.01); G06N 3/08 (2013.01); G06T 7/11 (2017.01); G06N 3/0481 (2013.01);
Abstract
An image analyzing apparatus reprojects an input image in a plurality of different directions to divide the input image into a plurality of partial images, extracts a feature amount from each of the partial images, and calculates a degree of importance of the input image by position from the extracted feature amount in accordance with a predetermined regression model.
Hara, Takayuki. (2020). Image analyzing apparatus, image analyzing method, and recording medium (U.S. Patent No. 10635926). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10635926
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile