The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2020

Filed:

Jun. 14, 2018
Applicant:

Honeywell International, Inc., Morris Plains, NJ (US);

Inventors:

Edward C. Bremer, Victor, NY (US);

Matthew Pankow, Camillus, NY (US);

Assignee:

Hand Held Products, Inc., Fort Mill, SC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/22 (2006.01); G01B 11/02 (2006.01); H04N 7/18 (2006.01);
U.S. Cl.
CPC ...
G06K 9/22 (2013.01); G01B 11/02 (2013.01); H04N 7/188 (2013.01);
Abstract

A terminal for measuring at least one dimension of an object includes at least one imaging subsystem and an actuator. The at least one imaging subsystem includes an imaging optics assembly operable to focus an image onto an image sensor array. The imaging optics assembly has an optical axis. The actuator is operably connected to the at least one imaging subsystem for moving an angle of the optical axis relative to the terminal. The terminal is adapted to obtain first image data of the object and is operable to determine at least one of a height, a width, and a depth dimension of the object based on effecting the actuator to change the angle of the optical axis relative to the terminal to align the object in second image data with the object in the first image data, the second image data being different from the first image data.


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