The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2020
Filed:
May. 01, 2019
Applicant:
Nec Corporation, Minato-ku, Tokyo, JP;
Inventor:
Masanao Natsumeda, Tokyo, JP;
Assignee:
NEC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G05B 23/02 (2006.01); G06F 11/32 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5009 (2013.01); G05B 23/0254 (2013.01); G05B 23/0272 (2013.01); G05B 2219/31455 (2013.01); G05B 2219/31477 (2013.01); G06F 11/323 (2013.01); G06F 11/3452 (2013.01);
Abstract
Clusters of metrics in a system are stored. A display region is divided into n divided regions in such a way that an area of a divided region i (1≤i≤n) is equal to or larger than an area of a divided region i+1. Each cluster is allocated to the divided region i sequentially selected from i=1, in the decreasing order of the number of metrics contained in each of the clusters, in such a way that the number of the clusters allocated to the divided region i+1 is equal to or more than the number of clusters allocated to the divided region i. The cluster allocated to the divided region i is drawn in the divided region i.