The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2020

Filed:

May. 24, 2017
Applicant:

SK Hynix Inc., Icheon-si Gyeonggi-do, KR;

Inventor:

Dong Ha Jung, Icheon-si, KR;

Assignee:

SK hynix Inc., Icheon-si Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 11/10 (2006.01); G11C 11/4096 (2006.01); G11C 29/52 (2006.01); G11C 5/04 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0727 (2013.01); G06F 11/0751 (2013.01); G06F 11/0787 (2013.01); G06F 11/1048 (2013.01); G11C 11/4096 (2013.01); G11C 29/52 (2013.01); G11C 5/04 (2013.01);
Abstract

A semiconductor device and or system may be provided. The semiconductor system may include a first semiconductor device and a second semiconductor device. The first semiconductor device may be configured to output a command/address signal, a first datum and a second datum. The first semiconductor device may be configured to receive a comparison signal relating to the first datum and the second datum. The second semiconductor device may be configured to store a first error code of the first datum and a second error code of the second datum based on the command/address signal during a write operation. The second semiconductor device may be configured to compare the first error code with the second error code to output the comparison signal based on the command/address signal during a read operation.


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