The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2020

Filed:

Feb. 22, 2018
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventor:

Yasuhiro Nakahama, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/4065 (2006.01); G06N 20/00 (2019.01); G06F 15/76 (2006.01); G06N 3/04 (2006.01); G06N 3/08 (2006.01); G05B 19/18 (2006.01); G05B 19/408 (2006.01); G06N 3/02 (2006.01);
U.S. Cl.
CPC ...
G05B 19/4065 (2013.01); G05B 19/182 (2013.01); G05B 19/4083 (2013.01); G06F 15/76 (2013.01); G06N 3/02 (2013.01); G06N 3/0454 (2013.01); G06N 3/084 (2013.01); G06N 20/00 (2019.01); G05B 2219/37252 (2013.01);
Abstract

A scattering direction, a scattering range, a scattering speed, or the like of chip generated by machining is acquired by image pickup unit, and a state (such as wearing and fracture) of a tool is estimated from the acquired dynamic information. A machine learning device is used to perform the estimation and the machine learning device is caused to learn a state of a tool relative to the combination of a plurality of dynamic information on the vicinity of the tool, and the state of the tool is estimated based on a result of the learning.


Find Patent Forward Citations

Nakahama, Yasuhiro. (2020). Tool state estimation apparatus and machine tool (U.S. Patent No. 10635081). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10635081

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