The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2020

Filed:

May. 01, 2017
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Ken Minoda, Utsunomiya, JP;

Takafumi Miyaharu, Utsunomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03F 7/00 (2006.01); G03F 9/00 (2006.01); G01D 5/38 (2006.01); G05B 19/19 (2006.01); G01B 11/25 (2006.01); G01D 5/18 (2006.01); B29L 11/00 (2006.01); G06T 7/00 (2017.01); H01L 21/304 (2006.01);
U.S. Cl.
CPC ...
G03F 7/0002 (2013.01); G01D 5/38 (2013.01); G03F 9/7042 (2013.01); G05B 19/19 (2013.01); B29L 2011/00 (2013.01); G01B 11/254 (2013.01); G01D 5/18 (2013.01); G03F 9/7038 (2013.01); G03F 9/7049 (2013.01); G03F 9/7069 (2013.01); G03F 9/7076 (2013.01); G05B 2219/37558 (2013.01); G06T 7/0004 (2013.01); G06T 2207/30148 (2013.01); H01L 21/304 (2013.01);
Abstract

A position detector includes a detection unit configured to detect light from a first diffraction grating including a first pattern disposed in a first direction, and light from a second diffraction grating including a second pattern disposed in the first direction, and a control unit configured to obtain a relative position between the first and the second diffraction gratings based on the light detected by the detection unit. The position detector has a third pattern formed in a second direction different from the first direction at edges of the first pattern of the first diffraction grating, the third pattern has a width smaller than a width of the first pattern of the first diffraction grating.


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