The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2020
Filed:
Dec. 08, 2015
Canon Kabushiki Kaisha, Tokyo, JP;
Michiie Sakamoto, Tokyo, JP;
Akinori Hashiguchi, Tokyo, JP;
Shinobu Masuda, Tokyo, JP;
Tsuguhide Sakata, Machida, JP;
Masahide Hasegawa, Yokohama, JP;
Masahiro Ando, Yokohama, JP;
Osamu Nagatsuka, Kawasaki, JP;
Koichiro Nishikawa, Takasaki, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A microscope system comprises a microscope body, an image sensor mounted on the microscope body, and a stage that moves in an X-axis direction and a Y-axis direction, and places a slide as an observation object. The stage includes a mark used to indicate a stage reference position. The microscope system obtains positions of the stage in the X-axis direction and the Y-axis direction, and detects the stage reference position indicated by a mark provided on the stage and a slide reference position indicated by a mark provided on a slide placed on the stage. The microscope system manages the position of the stage by coordinates based on the slide reference position if the slide reference position is detected, and manages the position of the stage by coordinates based on the stage reference position if the slide reference position is not detected.