The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2020
Filed:
Jul. 17, 2018
Nuctech Company Limited, Beijing, CN;
Tsinghua University, Beijing, CN;
Li Zhang, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Le Shen, Beijing, CN;
Qingping Huang, Beijing, CN;
Yunda Sun, Beijing, CN;
Xin Jin, Beijing, CN;
Hui Ding, Beijing, CN;
Yuxiang Xing, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Tsinghua University, Beijing, CN;
Abstract
The disclosure provides a scanning imaging system for security inspection of an object and an imaging method thereof, the system comprising: a conveying unit configured for bringing the object to move along a conveying direction; a plurality of radiographic sources at one side of the conveying unit, being arranged successively in a direction vertical to a plane, in which the conveying unit is located, and configured for alternately emitting ray beams to form a scanning area; a linear detector array at the other side of the conveying unit, being configured for detecting first projection images, which are formed after the ray beams emitted by the plurality of radiographic sources penetrate through the object, in the process of the object passing through the scanning area; an imaging unit configured for obtaining a first reconstructed image of the object based on the first projection images of the plurality of radiographic sources.