The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2020

Filed:

Nov. 28, 2017
Applicants:

Board of Regents, the University of Texas System, Austin, TX (US);

Dionex Corporation, Sunnyvale, CA (US);

Inventors:

Purnendu K. Dasgupta, Arlington, TX (US);

Akinde F. Kadjo, Grand Prairie, TX (US);

Kannan Srinivasan, Tracy, CA (US);

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/00 (2006.01); G01N 30/86 (2006.01); B01D 15/16 (2006.01); G01N 30/02 (2006.01); G01N 30/16 (2006.01); G01N 30/30 (2006.01);
U.S. Cl.
CPC ...
G01N 30/8637 (2013.01); B01D 15/161 (2013.01); B01D 15/163 (2013.01); G01N 30/02 (2013.01); G01N 30/16 (2013.01); G01N 30/30 (2013.01); G01N 30/86 (2013.01); G01N 2030/025 (2013.01); G01N 2030/027 (2013.01);
Abstract

Systems, methods and devices are taught for providing analytical methods for peak-shaped responses separated in time or space, including quantitation of chromatographic peaks based on a width measurement of a peak trace at a selected height as a quantitation element. Methods of treating a peak trace as a composition of exponential functions representing a leading and a trailing end are included. Methods that facilitate the detection of impurities in peak trace outputs are also included.


Find Patent Forward Citations

Loading…