The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2020
Filed:
Oct. 17, 2017
Canon Kabushiki Kaisha, Tokyo, JP;
Hiroshi Kawanago, Utsunomiya, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
The present invention provides a measuring apparatus having a housing in which an opening is formed, and measuring a reflection characteristic of a target region to be measured via the opening, the apparatus comprising an imaging device provided in the housing, and configured to capture an image of an imaging region via the opening, a detector configured to detect light reflected from the target region, which is a portion of the imaging region, a processor configured to obtain a reflection characteristic of the target region based on the light detected by the detecting unit, and a display unit configured to display the image of the imaging region captured by the imaging unit, wherein the image of the imaging region displayed by the display unit includes information indicating the target region.