The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2020
Filed:
Sep. 24, 2018
Topcon Corporation, Tokyo, JP;
Makoto Saika, Tokyo, JP;
TOPCON CORPORATION, Tokyo, JP;
Abstract
A lens characteristic evaluation device includes: a scanning optical system configured to scan a surface of a test lens with a linear luminous flux; a Hartmann plate provided on a side opposite to the scanning optical system with respect to the test lens and having a plurality of two-dimensionally arranged pinholes, the Hartmann plate being configured to transmit the linear luminous flux which has passed through the test lens and radiated on the pinholes by the scanning performed by the scanning optical system; a screen on which the linear luminous flux having passed through the Hartmann plate is projected; and a photographing optical system provided on a side opposite to the Hartmann plate with respect to the screen and configured to photograph the screen while the scanning with the linear luminous flux is being performed by the scanning optical system.