The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2020
Filed:
May. 03, 2017
Arges Gmbh, Wackersdorf, DE;
Markus Guggenmos, Schwandorf, DE;
Martin Hartmann, Burgthann, DE;
Bernhard Kiesbauer, Pleystein, DE;
Christiaan H. F. Velzel, Deurne, NL;
Sven Pekelder, EG Breugel, NL;
Rinze Frederik van der Kluit, LA Eindhoven, NL;
Arges GmbH, Wackersdorf, DE;
Abstract
The present invention is directed to an optical system for measuring the rotation angle of rotatable object having a rotation shaft (), which system comprises a reflective diffraction element () mounted on said shaft and a module that includes a radiation source () emitting a monochromatic beam (bo) towards this element and a radiation-sensitive detection structure (), the diffraction element is configured to project diffraction order images () of its pattern onto associated sections (()-()) of an annular grating structure forming part of the detection structure and the surface size of the diffraction element is smaller than 20% of the surface size of the annular grating structure.