The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2020
Filed:
Jun. 13, 2016
Applicant:
Georgia Tech Research Corporation, Atlanta, GA (US);
Inventors:
Farrokh Ayazi, Atlanta, GA (US);
Haoran Wen, Atlanta, GA (US);
Assignee:
Georgia Tech Research Corporation, Atlanta, GA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01C 19/5747 (2012.01); G01P 15/097 (2006.01); G01C 19/5642 (2012.01); G01P 15/125 (2006.01); G01P 15/08 (2006.01); G01D 5/241 (2006.01);
U.S. Cl.
CPC ...
G01C 19/5747 (2013.01); G01C 19/5642 (2013.01); G01P 15/097 (2013.01); G01P 15/125 (2013.01); G01D 5/241 (2013.01); G01P 2015/0848 (2013.01);
Abstract
An inertial measurement apparatus has mechanically bendable beams that have an isosceles trapezoid cross-section. The apparatus has a resonant member having a perimeter at least partially defined by a sidewall slanted at a first angular value and at least one electrode disposed adjacent, and parallel, to the sidewall and separated therefrom by a capacitive gap.