The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2020
Filed:
Aug. 21, 2019
Ocean University of China, Qingdao, CN;
Bingchen Liang, Qingdao, CN;
Zhuxiao Shao, Qingdao, CN;
Huajun Li, Qingdao, CN;
Huijun Gao, Qingdao, CN;
Hongda Shi, Qingdao, CN;
Fengguang Xue, Qingdao, CN;
Dejuan Zhang, Qingdao, CN;
Xinxin Liang, Qingdao, CN;
OCEAN UNIVERSITY OF CHINA, Shandong, CN;
Abstract
The present application relates to a method for selecting a wave height threshold, based on a target location, original wave height samples are acquired, and a wave height threshold interval are obtained; combined with wave height threshold and based on GPD and specified return period, a design wave height Hscorresponding to each threshold within the wave height threshold interval is calculated according to the sample wave height values which are greater that the threshold; a difference is calculated to obtain a stable threshold interval, and a threshold within the stable threshold interval is selected as a reasonable threshold for design wave height estimation. In this method, the stability of estimated values can be determined directly and objectively to realize wave height threshold selection.