The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2020

Filed:

Nov. 12, 2014
Applicant:

Grintech Gmbh, Jena, DE;

Inventors:

Herbert Gross, Großpürschütz, DE;

Bernhard Messerschmidt, Jena, DE;

Minyi Zhong, Jena, DE;

Marcel Kunze, Jena, DE;

Assignee:

GRINTECH GMBH, Jena, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/06 (2006.01); G01B 11/02 (2006.01); G02B 13/18 (2006.01);
U.S. Cl.
CPC ...
G01B 11/0608 (2013.01); G01B 11/026 (2013.01); G02B 13/18 (2013.01); G01B 2210/50 (2013.01);
Abstract

A device for contactless optical distance measurement includes a polychromatic light source, a light analysis unit and a measurement head. The measurement head has an aperture opening and an optical lens system, which has a chromatic longitudinal aberration. The optical lens system includes a first refractive lens element and a second refractive lens element. At least one of the refractive lens elements has at least one aspherical lens surface, and the first refractive lens element and/or the second refractive lens element has an optical material with an Abbe number 20<=Vd<=41. The optical lens system has such a chromatic longitudinal aberration that a measurement region, which equals an axial focal shift of the optical lens system between the wavelengths of 450 nm and 700 nm, is between 0.2 mm inclusive and 10 mm inclusive.


Find Patent Forward Citations

Loading…