The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2020

Filed:

Apr. 27, 2017
Applicant:

Jian Liu, San Jose, CA (US);

Inventor:

Jian Liu, San Jose, CA (US);

Assignee:

Other;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23K 26/323 (2014.01); B23K 26/03 (2006.01); B23K 26/046 (2014.01); B23K 26/0622 (2014.01); B23K 26/082 (2014.01); B23K 26/211 (2014.01); B23K 26/26 (2014.01); B23K 103/04 (2006.01); B23K 103/14 (2006.01); B23K 103/08 (2006.01); B23K 103/18 (2006.01); B23K 103/20 (2006.01);
U.S. Cl.
CPC ...
B23K 26/323 (2015.10); B23K 26/032 (2013.01); B23K 26/046 (2013.01); B23K 26/0624 (2015.10); B23K 26/082 (2015.10); B23K 26/211 (2015.10); B23K 26/26 (2013.01); B23K 2103/04 (2018.08); B23K 2103/14 (2018.08); B23K 2103/15 (2018.08); B23K 2103/18 (2018.08); B23K 2103/20 (2018.08); B23K 2103/26 (2018.08);
Abstract

Methods and systems for welding are disclosed, including generating electromagnetic radiation from an ultrashort pulse laser; coupling the electromagnetic radiation from the ultrashort pulse laser to a scanner comprising a scanning and focus range, wherein the scanner is configured to receive the electromagnetic radiation from the ultrashort laser and to scan and focus the electromagnetic radiation onto a joining interface of one or more materials; using a computer to adjust the pulse repetition rate and the average power of the ultrashort pulse laser; using one or more stages to position the joining interface; using a dichroic filter positioned between the scanner and the one or more materials; and focusing an imager and processor through the dichroic filter and onto the joining interface to monitor the joining interface of the one or more materials within the scanning and focus range of the electromagnetic radiation. Other embodiments are described and claimed.


Find Patent Forward Citations

Loading…