The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2020
Filed:
Feb. 14, 2018
Fujifilm Corporation, Tokyo, JP;
Takahisa Arai, Ashigarakami-gun, JP;
Tomoki Inoue, Ashigarakami-gun, JP;
Takeshi Okubo, Ashigarakami-gun, JP;
FUJIFILM Corporation, Minato-Ku, Tokyo, JP;
Abstract
A control unit sets an angle of incidence of radiation, incident on a detection surface of a radiation detector with respect to the detection surface, to a plurality of angles different from each other including an angle (0 degrees) in a normal direction of the detection surface, and acquires at least one of a plurality of projection images captured by the radiation detector in accordance with the angle of incidence or reconstructed images reconstructed using the projection images. In addition, the control unit generates a first synthetic mammogram image on the basis of the one image. In addition, the control unitgenerates a second synthetic mammogram image by synthesizing a high-frequency image having a high-frequency component higher than a predetermined frequency of the first synthetic mammogram image and a low-frequency image having a low-frequency component of equal to or lower than a predetermined frequency of a zero-degree projection image.