The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2020
Filed:
Feb. 22, 2018
Amo Wavefront Sciences, Llc, Santa Ana, CA (US);
Daniel R. Neal, Tijeras, NM (US);
Richard J. Copland, Albuquerque, NM (US);
Jason Hoy, Albuquerque, NM (US);
Wei Xiong, Albuquerque, NM (US);
AMO Development, LLC, Santa Ana, CA (US);
Abstract
An optical measurement instrument performs a series of wavefront measurements to obtain a plurality of sets of wavefront aberrometry data for an eye, and performs a series of corneal topography measurements to obtain a plurality of sets of corneal topography data for the eye. Each set of wavefront aberrometry data is obtained at a corresponding different point in time, and each set of corneal topography data is obtained at a corresponding different point in time. The wavefront aberrometry data and the corneal topography data are processed to produce combined tear film breakup data as a function of time. The combined tear film breakup data may be employed as a metric for evaluating a level of tear film breakup of the eye as a function of time.