The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2020
Filed:
Jul. 13, 2016
Applicant:
Fluke Corporation, Everett, WA (US);
Inventors:
Thomas Heinke, Santa Cruz, CA (US);
James T. Pickett, Santa Cruz, CA (US);
Assignee:
Fluke Corporation, Everett, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/33 (2006.01); G01J 5/02 (2006.01); G01J 5/08 (2006.01); G01K 1/02 (2006.01); G06T 11/20 (2006.01); H04N 5/225 (2006.01); H04N 5/232 (2006.01); G01J 5/00 (2006.01);
U.S. Cl.
CPC ...
H04N 5/33 (2013.01); G01J 5/025 (2013.01); G01J 5/026 (2013.01); G01J 5/0265 (2013.01); G01J 5/084 (2013.01); G01J 5/0806 (2013.01); G01J 5/0846 (2013.01); G01J 5/0859 (2013.01); G01K 1/02 (2013.01); G06T 11/206 (2013.01); H04N 5/2258 (2013.01); H04N 5/23216 (2013.01); H04N 5/23293 (2013.01); G01J 2005/0077 (2013.01);
Abstract
Methods and apparatus for monitoring a temperature of an object over time using a thermal imaging camera. The methods and apparatus may gather infrared temperature data from a selected source of temperature data within a scene at a selected time interval and display a graphical plot of the gathered temperature data on a digital display.