The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2020

Filed:

Jun. 20, 2012
Applicant:

Long X. Nguyen, Seattle, WA (US);

Inventor:

Long X. Nguyen, Seattle, WA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 43/10 (2013.01);
Abstract

Methods and apparatus for tightly-coupled external cluster monitoring are disclosed. A system includes a service-providing cluster with a first set of nodes, and a monitoring cluster with a second set of nodes. Nodes of the monitoring cluster comprise respective monitoring agents operable to issue probes to nodes of the service-providing cluster in accordance with a first cluster health monitoring policy, and generate a health check record of the service-providing cluster based on probe results. At least one node of the service-providing cluster comprises a meta-monitoring agent operable to generate a health check record indicative of a health state of the monitoring cluster based at least in part on a second cluster health monitoring policy.


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