The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2020

Filed:

Apr. 06, 2017
Applicant:

Secure-ic Sas, Cesson-Sévigné, FR;

Inventors:

Sylvain Guilley, Paris, FR;

Jean-Luc Danger, Antony, FR;

Philippe Nguyen, Rennes, FR;

Assignee:

SECURE-IC SAS, Cesson-Sévigné, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 9/32 (2006.01); G09C 1/00 (2006.01); G06F 11/263 (2006.01);
U.S. Cl.
CPC ...
H04L 9/3278 (2013.01); G06F 11/263 (2013.01); G09C 1/00 (2013.01); H04L 2209/12 (2013.01); H04L 2209/26 (2013.01);
Abstract

There is provided a method for testing a Physically Unclonable Function (PUF) implemented in a device, said PUF being configured to receive at least one challenge, each challenge comprising a set of bits, and to produce a set of responses, each response comprising at least one bit and corresponding to one challenge, said PUF comprising a circuitry including a set of PUF elements, each PUF element being controlled by at least one input bit corresponding to at least one bit of said challenge, wherein the method comprises the steps of:


Find Patent Forward Citations

Guilley, Sylvain. (2020). Device and method for testing a physically unclonable function (U.S. Patent No. 10630492). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10630492

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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