The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2020
Filed:
Nov. 16, 2016
Applicants:
Micromass Uk Limited, Wilmslow, GB;
Leco Corporation, St. Joseph, MI (US);
Inventors:
John Brian Hoyes, Stockport, GB;
Anatoly Verenchikov, Montenegro, RU;
Mikhail Yavor, St. Petersburg, RU;
Keith Richardson, New Mills-High Peak, GB;
Jason Wildgoose, Stockport, GB;
Assignees:
MICROMASS UK LIMITED, Wilmslow, GB;
LECO CORPORATION, St. Joseph, MI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/40 (2006.01); H01J 49/00 (2006.01); H01J 49/10 (2006.01); H01J 49/06 (2006.01); H01J 49/46 (2006.01);
U.S. Cl.
CPC ...
H01J 49/405 (2013.01); H01J 49/0004 (2013.01); H01J 49/009 (2013.01); H01J 49/062 (2013.01); H01J 49/067 (2013.01); H01J 49/10 (2013.01); H01J 49/107 (2013.01); H01J 49/406 (2013.01); H01J 49/46 (2013.01);
Abstract
A time-of-flight mass spectrometer is disclosed comprising ion optics that map an array of ions at an ion source array () to a corresponding array of positions on a position sensitive ion detector (). The ion optics include at least one gridless ion mirror () for reflecting ions, which may compensate for various aberrations and allows the spectrometer to have relatively high mass and spatial resolutions.