The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2020

Filed:

Aug. 23, 2018
Applicant:

Smiths Detection, Inc., Edgewood, MD (US);

Inventors:

Vadym Berkout, Rockville, MD (US);

Thomas D. Saul, Edgewood, MD (US);

Assignee:

SMITHS DETECTION INC., Edgewood, MD (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/06 (2006.01); H01J 49/26 (2006.01); H01J 49/00 (2006.01); H01J 49/04 (2006.01); H01J 49/10 (2006.01);
U.S. Cl.
CPC ...
H01J 49/062 (2013.01); H01J 49/0027 (2013.01); H01J 49/0404 (2013.01); H01J 49/0477 (2013.01); H01J 49/26 (2013.01); H01J 49/105 (2013.01);
Abstract

A low temperature plasma probe, a mass spectrometry system, and a method for using a low temperature plasma probe are described. In an embodiment, a low temperature plasma probe includes an intake capillary that provides an ion flow from a sample surface to a mass spectrometer; at least one low temperature plasma tube that provides low temperature plasma gas; at least one heated gas tube that provides heated gas to the sample surface, where the heated gas enhances desorption and ionization of a sample on the sample surface.


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