The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2020

Filed:

Oct. 27, 2017
Applicant:

Beijing Neusoft Medical Equipment Co., Ltd., Beijing, CN;

Inventors:

Shuangxue Li, Shenyang, CN;

Liang Ren, Shenyang, CN;

Shanshan Lou, Shenyang, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2006.01); A61B 6/00 (2006.01); A61B 6/03 (2006.01); G01N 23/046 (2018.01);
U.S. Cl.
CPC ...
G06T 11/005 (2013.01); A61B 6/032 (2013.01); A61B 6/4233 (2013.01); A61B 6/482 (2013.01); A61B 6/54 (2013.01); G01N 23/046 (2013.01); G01N 2223/419 (2013.01); G01N 2223/427 (2013.01);
Abstract

The present disclosure provides a sampling method and sampling apparatus of a scanning device. In at least one example, the sampling method comprises acquiring a ray attenuation variation at each of a plurality of scanning angles of the scanning device, determining a corrected sampling interval at each of the scanning angles of the scanning device by adjusting an initial sampling interval at each of the scanning angles of the scanning device according to the ray attenuation variation at each of scanning angles, and performing actual sampling according to the corrected sampling interval at each of the scanning angles of the scanning device.


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