The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2020
Filed:
May. 25, 2018
Applicant:
Qualcomm Incorporated, San Diego, CA (US);
Inventors:
Yan Deng, San Diego, CA (US);
Michel Adib Sarkis, San Diego, CA (US);
Yingyong Qi, San Diego, CA (US);
Assignee:
QUALCOMM Incorporated, San Diego, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/80 (2017.01); G06T 7/73 (2017.01); G06T 5/50 (2006.01); G06T 7/00 (2017.01); H04N 1/00 (2006.01); H04N 9/04 (2006.01); H04N 5/235 (2006.01);
U.S. Cl.
CPC ...
G06T 7/80 (2017.01); G06T 5/50 (2013.01); G06T 7/75 (2017.01); G06T 7/97 (2017.01); H04N 1/00 (2013.01); H04N 5/2353 (2013.01); H04N 9/045 (2013.01); G06T 2207/20208 (2013.01);
Abstract
A method is described. The method includes determining normalized radiance of an image sequence based on a camera response function (CRF). The method also includes determining one or more reliability images of the image sequence based on a reliability function corresponding to the CRF. The method further includes extracting features based on the normalized radiance of the image sequence. The method additionally includes optimizing a model based on the extracted features and the reliability images.