The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2020

Filed:

Oct. 09, 2018
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Jiang Hsieh, Waukesha, WI (US);

Gopal Avinash, San Ramon, CA (US);

Saad Sirohey, Pewaukee, WI (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); G16H 30/40 (2018.01); G16H 40/40 (2018.01); G16Z 99/00 (2019.01); G06N 3/04 (2006.01); G06N 3/08 (2006.01); G06F 19/00 (2018.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06F 19/00 (2013.01); G06N 3/04 (2013.01); G06N 3/08 (2013.01); G16H 30/40 (2018.01); G16H 40/40 (2018.01); G16Z 99/00 (2019.02); G06T 2207/10004 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

Methods and apparatus for improved deep learning for image acquisition are provided. An imaging system configuration apparatus includes a training learning device including a first processor to implement a first deep learning network (DLN) to learn a first set of imaging system configuration parameters based on a first set of inputs from a plurality of prior image acquisitions to configure at least one imaging system for image acquisition, the training learning device to receive and process feedback including operational data from the plurality of image acquisitions by the at least one imaging system. The example apparatus includes a deployed learning device including a second processor to implement a second DLN, the second DLN generated from the first DLN of the training learning device, the deployed learning device configured to provide a second imaging system configuration parameter to the imaging system in response to receiving a second input for image acquisition.


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