The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2020

Filed:

Mar. 29, 2017
Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;

Inventors:

Atsushi Yoshida, Osaka, JP;

Wei Zhang, Osaka, JP;

Yosuke Tajika, Hyogo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 99/00 (2011.01); G05B 23/00 (2006.01); F25B 49/00 (2006.01); G06Q 10/00 (2012.01);
U.S. Cl.
CPC ...
G06Q 10/20 (2013.01); G01M 99/005 (2013.01);
Abstract

A degradation estimation method includes: a service record acquiring step acquiring a service record of maintenance of a device; an analysis step analyzing a degradation state of the device from the service record; a determination standard adjustment step adjusting a first determination standard to a second determination standard depending on the analyzed degradation state, the first determination standard being determined in advance for estimating whether there is degradation of the device or not; a device data acquisition step acquiring first device data indicating state of the device; and a first degradation estimation step estimating whether there is degradation of the device or not using the acquired first device data and the second determination standard.


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