The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2020

Filed:

Mar. 29, 2018
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Bolan Jiang, San Diego, CA (US);

Xin Li, Bethlehem, PA (US);

Shuxue Quan, San Diego, CA (US);

Yunke Pan, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/66 (2006.01); G06K 9/62 (2006.01); G06K 9/32 (2006.01); G06N 3/04 (2006.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6232 (2013.01); G06K 9/3241 (2013.01); G06K 9/6272 (2013.01); G06K 9/66 (2013.01); G06N 3/0454 (2013.01); G06N 3/084 (2013.01);
Abstract

Provided are systems, methods, and computer-readable medium for operating a neural network. In various implementations, the neural network can receive an input image that includes an object to be identified. The neural network can generate a plurality of initial feature maps using a convolution layers, wherein a first initial feature maps is generated using the input image. The neural network can generate an up-sampled feature map using a de-convolution layer that takes an initial feature map as input, where the up-sampled feature map has a same resolution as the previous initial feature map. The neural network can combine the up-sampled feature map and the previous initial feature map, and use the combined feature map to more accurate identify the object.


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