The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2020

Filed:

Mar. 15, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Diyanesh B. Chinnakkonda Vidyapoornachary, Bangalore, IN;

Marc A. Gollub, Pflugerville, TX (US);

Warren E. Maule, Cedar Park, TX (US);

Tony E. Sawan, Round Rock, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
G06F 11/076 (2013.01); G06F 11/073 (2013.01); G06F 11/0727 (2013.01); G06F 11/106 (2013.01);
Abstract

An aspect includes a method for dynamic random access memory (DRAM) scrub and error counting. A scrub operation is performed at memory locations in a DRAM. The performing includes, for each of the memory locations: receiving a refresh command at the DRAM; executing a read/modify/write (RMW) operation at the memory location, the executing including writing corrected bits to the memory location; and incrementing an error count in response to detecting an error during the executing. The method also includes comparing the error count to an error threshold. An alert is initiated in response to the error count exceeding the error threshold.


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